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The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.
This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
This Laser Beam Profiler from DataRay is equipped with a CQD sensor and offers a spectral response in the SWIR range of 400 - 1700 nm with resolutions up to 1920 x 1080 pixel.
The combination of the WinCamD-IRBB and a PPBS provides a perfect solution for measuring high-power CO2 lasers.
The beam profiling cameras BladeCam2-HR and BladeCam2-XHR combine an extremely compact design (housing depth of only 12.84 mm) with a very high resolution.
The Industrial Laser Monitoring System (ILMS) from DataRay combines a reimaging LensPlat2 assembly with a high-power Polarization Preserving Beam Sampler. This system is designed to measure beam spots as small as a few microns.
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 μm in width.
A main feature of the WinCamD is the optional M2 Stage. Thus, it can be easily extended to a complete M2 measurement system.
In combination with the Beam Profiler "WindCamD", the ND filter is used to attenuate or suppress the ambient light.
By means of the described UV converter optics the measurement of the intensity distribution of UV laser radiation with standard Si-based CCD or CMOS cameras is possible.
IR converter optics for Beam Profiler for measuring intensity distribution in the NIR range between 1480 and 1600 nm.
The scanning system BeamR with rotating slots for the measurement of lasers with diameters of 0.5 microns to about 3 mm.
This optical beam reducer to be connected to the C-mount a camera WinCamD-ray analysis is used when the beam diameter of the laser is much greater than the sensor chip or of the taper.