Product successfully added to your shopping cart
Quantity
There are 0 items in your cart. There is 1 item in your cart.
Total products:
Total (tax excl.):
Selection
The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.
This laser beam profiler features a CMOS sensor that guarantees frame rates of up to 60 Hz with high dynamics and is suitable for large beam diameters up to 11 mm.
In combination with the Beam Profiler "WindCamD", the ND filter is used to attenuate or suppress the ambient light.
A main feature of the WinCamD is the optional M2 Stage. Thus, it can be easily extended to a complete M2 measurement system.
By means of the described UV converter optics the measurement of the intensity distribution of UV laser radiation with standard Si-based CCD or CMOS cameras is possible.
IR converter optics for Beam Profiler for measuring intensity distribution in the NIR range between 1480 and 1600 nm.
The scanning system BeamR with rotating slots for the measurement of lasers with diameters of 0.5 microns to about 3 mm.
This optical beam reducer to be connected to the C-mount a camera WinCamD-ray analysis is used when the beam diameter of the laser is much greater than the sensor chip or of the taper.
Laser beam profiler with fiber optic taper for characterizing large laser beams up to 25 mm x 25 mm.
Based on the patented multi plane scanning technology the scanning system the BeamMap allows the measurement of focal position, beam diameter (according to ISO 11146), divergence and the M2 factor of different focussed cw or qcw laser beams in real time.
This adapter plate is also available for the Beam Profiler BeamMap and BeamR 1st generation.
The beam analysis camera WinCamD-IR-BB with integrated microbolometer array enables analyzes on long-wave lasers in the range of 2 μm to 16 μm.
The Polarization Preserving Beam Sampler (PPBS) uses a dual wedge design to sample a small percentage of a beam’s power for laser beam profiling applications.
