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Wavelength-Dependent Performance Measurement (Swept Wavelength System)

Reference: VIA-MAP-SWS

Viavi Swept Wavelength System for full characterization of wavelength-dependent properties.

0,00 € tax excl.

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Product description

Wavelength-dependent performance measurement for the optical test platform

A test solution for manufacturers and developers of passive DWDM components, ROADMs & optical switches.

Viavi's Swept Wavelength System (formerly JDSU) provides full characterization of wavelength-dependent properties (insertion loss, polarization-dependent attenuation, return loss) and directional properties of DWDM components


  • Scalable architecture, up to 8 measuring stations can be powered from one source
  • +/- 0.002 nm absolute wavelength accuracy
  • Up to 256 measuring channels (detectors) per station
  • High speed scanning (up to 40 nm / s)
  • Flexible and simple control panel

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