Laser beam profile measurements for industrial applications

Industrial Laser Monitoring System (ILMS)

The ILMS is specially designed for profiling focused, high-power industrial lasers. This system combines reimaging/magnification optics, a polarization preserving beam sampler and a DataRay beam profiler to measure small beam waists which would otherwise damage a traditional profiling system. Magnification of the focused beam allows full pixel-by-pixel 2D measurements of beam spots as small as a few microns.

The system is compatible with most DataRay profilers and supported by the full-featured, highly customizable and user-centric software (included without licensing fees). The software automatically accounts for the magnification of the system, so results do not require post processing or corrections.

System Features

• Wavelength options from 190 nm to 16 µm

• Beam waist diameters down to a few µm (depending on the wavelength and general setup)

• High magnification options available (50X and beyond)

• Capable of measuring high power beams, up to kW range with implemented PPBS (polarization preserving beam samplers):
• UV Fused Silica (190 nm – 2100 nm)
• Barium Flouride (0.2 µm – 11 µm)
• Calcium Flouride (0.2 µm – 8 µm)
• Zinc Selenide (0.5 µm – 16 µm)

• Three swappable ND filters for flexible attenuation

• DataRay beam profiling camera (can easily be removed and used as a stand-alone camera)

• Optional: integrated power meter - please contact us for more information

Applications and compatibilities

Quality control for tightly focused beams, fiber ends, edge couplers, laser diodes and more High power laser cutting and welding systems Ultra-short-pulsed lasers Telecommunications