The quality of the radiation is often referred to in material processing and measurement technology. Depending on the application, the quality is determined by the temporal and local stability of the output power, the width of the frequency spectrum, the temporal and local coherence, and the magnitude of the beam divergence, which is related to the extent to which the radiation can be focused.
Laser Beam Profiler, which is ideally suited for multispectral THz laser beam analysis in the range of 3 THz to 20 THz.
Lens Assembly transforms Beam Profiler to Infrared Imager.
The BladeCam-XHR combines an extremely compact design (housing depth of only 6.5 mm) with a very high resolution of the sensor.
Extended WinCamD version with the highest resolution of this product family.
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 μm in width.